|M.Sc Student||Meshkov Lyubov|
|Subject||Binomial Approach to Truncated Sequential Test Design in|
|Department||Department of Quality Assurance and Reliability||Supervisor||Dr. Yefim Haim Michlin|
|Full Thesis text - in Hebrew|
The work presents results of an analysis of the sequential test (ST) procedures described in MIL-HDBK-781A and IEC 61124, and intended for checking the mean time between failures (TBF) value under exponential distribution of the TBF. The methodological basis of the calculations consists in discretization of the ST process through subdivision of the time axis in small segments. By this means the process is converted into a binomial for which an algorithm and a fast computer program have been developed, and most important of all - a tool is provided for searching for the optimal truncation. The influence of truncation by time on the expected test time (ETT) characteristics was studied, and an improved truncation method, minimizing this influence, was developed. The distributions of the test times were determined. The Type A plan characteristics in IEC 61124:2006 have substantial inconsistencies in the probabilities of types I and II errors (up to a factor of 2) and in the ETT (up to 17%). These were checked by the authors by the binomial-recursive method and by simulation. The Type C plans, reproduced from GOST R27.402:2005, are consistent, but there is scope (and need) for substantial improvement of the search algorithm for the optimal parameters.